Cmos-based thermopile with reduced thermal conductance

ABSTRACT

An integrated circuit containing CMOS transistors and an embedded thermoelectric device is formed by forming isolation trenches in a substrate, concurrently between the CMOS transistors and between thermoelectric elements of the embedded thermoelectric device. Dielectric material is formed in the isolation trenches to provide field oxide which laterally isolates the CMOS transistors and the thermoelectric elements. Germanium is implanted into the substrate in areas for the thermoelectric elements, and the substrate is subsequently annealed, to provide a germanium density of at least 0.10 atomic percent in the thermoelectric elements between the isolation trenches. The germanium may be implanted before the isolation trenches are formed, after the isolation trenches are formed and before the dielectric material is formed in the isolation trenches, and/or after the dielectric material is formed in the isolation trenches.

CROSS-REFERENCE TO RELATED APPLICATIONS

The following co-pending patent applications are related and herebyincorporated by reference in their entirety: U.S. patent applicationSer. No. 12/______ (Texas Instruments docket number TI-69117, filedsimultaneously with this application) and U.S. patent application Ser.No. 12/______ (Texas Instruments docket number TI-74803, filedsimultaneously with this application). With its mention in this section,these patent applications are not admitted to be prior art with respectto the present invention.

BACKGROUND

The disclosures herein relate to integrated circuits, and in particular,to a CMOS based thermopile with reduced thermal conductance.

Thermoelectric devices which are fabricated as parts of integratedcircuits, in which the thermoelectric elements are formed of silicon,tend to have poor performance due to thermal conduction through thethermoelectric elements, reducing the temperature difference across thethermoelectric elements.

SUMMARY

The following presents a simplified summary in order to provide a basicunderstanding of one or more aspects of the invention. This summary isnot an extensive overview of the invention, and is neither intended toidentify key or critical elements of the invention, nor to delineate thescope thereof. Rather, the primary purpose of the summary is to presentsome concepts of the invention in a simplified form as a prelude to amore detailed description that is presented later.

An integrated circuit containing complementary metal oxide semiconductor(CMOS) transistors and an embedded thermoelectric device are formed byforming isolation trenches in a substrate, concurrently between the CMOStransistors and between thermoelectric elements of the embeddedthermoelectric device. Dielectric material is formed in the isolationtrenches to provide field oxide which laterally isolates the CMOStransistors and the thermoelectric elements. Germanium is implanted intothe substrate in areas for the thermoelectric elements, and thesubstrate is subsequently annealed, to provide a germanium density of atleast 0.10 atomic percent in the thermoelectric elements between theisolation trenches. The germanium may be implanted before the isolationtrenches are formed, after the isolation trenches are formed and beforethe dielectric material is formed in the isolation trenches, and/orafter the dielectric material is formed in the isolation trenches.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a cross section of an example integrated circuit containingCMOS transistors and an embedded thermoelectric device.

FIG. 2A through FIG. 2G are cross sections of another example integratedcircuit containing CMOS transistors and an embedded thermoelectricdevice, depicted in successive stages of an example fabricationsequence.

FIG. 3A and FIG. 3B are cross sections of another example integratedcircuit containing CMOS transistors and an embedded thermoelectricdevice, depicted in successive stages of an example fabricationsequence.

FIG. 4A and FIG. 4B are cross sections of another example integratedcircuit containing CMOS transistors and an embedded thermoelectricdevice, depicted in successive stages of an example fabricationsequence.

FIG. 5A and FIG. 5B are cross sections of another example integratedcircuit containing CMOS transistors and an embedded thermoelectricdevice, depicted in successive stages of an example fabricationsequence.

FIG. 6A and FIG. 6B are cross sections of another example integratedcircuit containing CMOS transistors and an embedded thermoelectricdevice, depicted in successive stages of an example fabricationsequence.

FIG. 7A and FIG. 7B are cross sections of another example integratedcircuit containing CMOS transistors and an embedded thermoelectricdevice, depicted in successive stages of an example fabricationsequence.

FIG. 8 and FIG. 9 are top views of example integrated circuitscontaining CMOS transistors and embedded thermoelectric devices.

DETAILED DESCRIPTION

The attached figures are not drawn to scale and they are provided merelyto illustrate. Several aspects are described below with reference toexample applications for illustration. It should be understood thatnumerous specific details, relationships, and methods are set forth toprovide an understanding of the examples. One skilled in the relevantart, however, will readily recognize one or more of the specific detailsor with other methods may not be necessary. In other instances,well-known structures or operations are not shown in detail. Thedisclosures are not limited by the illustrated ordering of acts orevents, as some acts may occur in different orders and/or concurrentlywith other acts or events. Furthermore, not all illustrated acts orevents are required to implement a methodology.

An integrated circuit containing CMOS transistors and an embeddedthermoelectric device are formed by forming isolation trenches in asubstrate, concurrently between the CMOS transistors and betweenthermoelectric elements of the embedded thermoelectric device.Dielectric material is formed in the isolation trenches to provide fieldoxide for the CMOS transistors and thermal isolation for thethermoelectric elements. Germanium is implanted into the substrate inareas for the thermoelectric elements, and the substrate is subsequentlyannealed, to provide a germanium density of at least 0.10 atomic percentthroughout the thermoelectric elements between the isolation trenches.The germanium may be implanted before the isolation trenches are formed,after the isolation trenches are formed and before the dielectricmaterial is formed in the isolation trenches, and/or after thedielectric material is formed in the isolation trenches.

FIG. 1 is a cross section of an example integrated circuit containingCMOS transistors and an embedded thermoelectric device. The integratedcircuit 100 is formed on a substrate 102 including silicon-basedsemiconductor material which may be for example a single crystal bulksilicon wafer or a silicon wafer with a silicon epitaxial layer. Theintegrated circuit 100 includes an area for the CMOS transistors 104 andan area for the embedded thermoelectric device 106. The CMOS transistors104 include an n-channel metal oxide semiconductor (NMOS) transistor 108and a p-channel metal oxide semiconductor (PMOS) transistor 110. Theembedded thermoelectric device 106 includes n-type thermoelectricelements 112 and p-type thermoelectric elements 114 in the substrate102, extending to a top surface 116 of the substrate 102. The n-typethermoelectric elements 112 and p-type thermoelectric elements 114 areless than 300 nanometers wide at a narrowest position, for example atthe top surface 116 of the substrate 102. The integrated circuit 100includes field oxide 118 in isolation trenches laterally isolating theNMOS transistor 108, the PMOS transistor 110, the n-type thermoelectricelements 112 and p-type thermoelectric elements 114. The field oxide 118may be formed by a shallow trench isolation (STI) process.

The NMOS transistor 108 includes a gate structure 120 over the substrate102 and n-type source/drain regions 122 in the substrate 102 adjacent toand partially underlapping the gate structure 120. The PMOS transistor110 includes a gate structure 124 over the substrate 102 and p-typesource/drain regions 126 in the substrate 102 adjacent to and partiallyunderlapping the gate structure 124. Metal interconnects 128 provideelectrical connections to the n-type source/drain regions 122 and thep-type source/drain regions 126.

The embedded thermoelectric device 106 includes a metal interconnectstructure 130 which connects upper ends 132 of the n-type thermoelectricelements 112 and the p-type thermoelectric elements 114, electricallyand thermally, to a thermal node 134. The thermal node 134 may be, forexample, an interconnect element in a top layer of metallization of theintegrated circuit 100 as depicted in FIG. 1. The embeddedthermoelectric device 106 may also include thermal taps 136 whichconnect lower ends 138 of the n-type thermoelectric elements 112 and thep-type thermoelectric elements 114, electrically and thermally, toterminals 140 of the embedded thermoelectric device 106. The thermaltaps 136 have low thermal impedances to the substrate 102 under andadjacent to the n-type thermoelectric elements 112 and the p-typethermoelectric elements 114, so that energy release by charge carriersfrom the type thermoelectric elements 112 and 114 entering the metalinterconnects in the thermal taps 136 does not disadvantageously causesignificant thermal drops which reduce performance of the embeddedthermoelectric device 106.

The NMOS transistor 108 and the p-type thermoelectric elements 114 aredisposed in one or more p-type wells 142. The p-type well 142 of theNMOS transistor 108 and the p-type well 142 of the p-type thermoelectricelements 114 may be the same p-type well 142 as depicted in FIG. 1, ormay be separate. The PMOS transistor 110 and the n-type thermoelectricelements 112 are disposed in one or more n-type wells 144. The n-typewell 144 of the PMOS transistor 110 and the n-type well 144 of then-type thermoelectric elements 112 may be separate as depicted in FIG.1, or may be the same n-type well 144.

A dielectric layer stack 146 is formed over the substrate 102 as part ofa back-end-of-line (BEOL) structure of the integrated circuit 100. Thedielectric layer stack 146 may include a pre-metal dielectric (PMD)layer and a plurality of inter-metal dielectric (IMD) layers andintra-level dielectric (ILD) layers. The dielectric layer stack 146 mayinclude silicon dioxide, boron-phosphorus silicate glass (BPSG), low-kdielectric materials, and possibly silicon nitride and/or siliconcarbide nitride cap layers and etch stop layers. The metal interconnects128 on the NMOS and PMOS transistors 108 and 110, and the metalinterconnect structure 130 and the thermal taps 136 of the embeddedthermoelectric device 106 are disposed in the dielectric layer stack146.

The n-type thermoelectric elements 112 and the p-type thermoelectricelements 114 are disposed in a germanium implanted region 148 which hasat least 0.10 atomic percent germanium in the n-type thermoelectricelements 112 and the p-type thermoelectric elements 114. In someversions of the instant example, the germanium implanted region 148 mayhave at least 3 atomic percent germanium in the n-type thermoelectricelements 112 and the p-type thermoelectric elements 114. The germaniumimplanted region 148 may extend below the field oxide 118 as depicted inFIG. 1, or may be substantially coextensive with the n-typethermoelectric elements 112 and the p-type thermoelectric elements 114.Having at least 0.10 atomic percent germanium in the n-typethermoelectric elements 112 and the p-type thermoelectric elements 114reduces thermal conduction between the upper ends 132 and the lower ends138 of the n-type thermoelectric elements 112 and the p-typethermoelectric elements 114, advantageously improving performance of theembedded thermoelectric device 106. Having at least 3 atomic percentgermanium in the n-type thermoelectric elements 112 and the p-typethermoelectric elements 114 further reduces thermal conduction betweenthe upper ends 132 and the lower ends 138 of the n-type thermoelectricelements 112 and the p-type thermoelectric elements 114, advantageouslyimproving performance of the embedded thermoelectric device 106 morethan embedded thermoelectric devices with less than 3 atomic percentgermanium.

FIG. 2A through FIG. 2G are cross sections of another example integratedcircuit containing CMOS transistors and an embedded thermoelectricdevice, depicted in successive stages of an example fabricationsequence. Referring to FIG. 2A, the integrated circuit 200 is formed ona substrate 202 including silicon-based semiconductor material. Thesubstrate 202 may be substantially all silicon, with dopants such asboron or phosphorus at an average density of 1×10¹⁶ cm⁻³ to 1×10¹⁸ cm⁻³proximate to a top surface 216 of the substrate 202. The integratedcircuit 200 includes an area for the CMOS transistors 204 and an areafor the embedded thermoelectric device 206. An isolation hard mask 250is formed over the substrate 202 so as to cover active areas of theintegrated circuit 200 and expose areas for subsequently-formed fieldoxide. The isolation hard mask 250 may include a layer of pad oxide, 5nanometers to 20 nanometers thick, formed by thermal oxidation at thetop surface 216, and a layer of silicon nitride, 50 nanometers to 150nanometers thick, formed by low pressure chemical vapor deposition(LPCVD), on the layer of pad oxide. Isolation trenches 252 are formed inthe substrate 202 in areas exposed by the isolation hard mask 250. Theisolation trenches 252 are 200 nanometers to 500 nanometers deep in thesubstrate 202, formed by a timed reactive ion etch (RIE) process.Thermal oxide may be formed at exposed sides and bottom surfaces of theisolation trenches 252 to electrically passivate the surfaces. Theactive areas include areas for n-type thermoelectric elements 212 andp-type thermoelectric elements 214 of the embedded thermoelectric device206. The n-type thermoelectric elements 212 and p-type thermoelectricelements 214 are less than 300 nanometers wide at a narrowest position,for example at the top surface 216 of the substrate 202. Forming then-type thermoelectric elements 212 and p-type thermoelectric elements214 concurrently with the isolation trenches 252 in the area for theCMOS transistors 204 advantageously reduces fabrication cost andcomplexity of the integrated circuit 200.

Germanium 254 is implanted into the substrate 202 to form a germaniumimplanted region 248 along the exposed sides and bottom surfaces of theisolation trenches 252 and possibly under the isolation hard mask 250.The germanium 254 is implanted with a dose sufficient to provide atleast 0.10 atomic percent germanium in active areas forsubsequently-formed n-type and p-type thermoelectric elements of theembedded thermoelectric device 206. The germanium 254 may be implantedwith a dose sufficient to provide at least 3 atomic percent germanium inthe active areas for the n-type and p-type thermoelectric elements 212and 214. The germanium 254 may be implanted in four rotated steps at atilt angle of 15 degrees to 45 degrees, as depicted in FIG. 2A, toincrease an implanted concentration of the germanium 254 on the exposedsides of the isolation trenches 252. The germanium 254 may further beimplanted in several steps at different energies to provide a moreuniform distribution of the germanium 254 in the germanium implantedregion 248.

A diffusion suppressant species 256 such as carbon and/or fluorine, mayoptionally be implanted into the substrate 202 along the exposed sidesand bottom surfaces of the isolation trenches 252 to reduce diffusion ofthe germanium 254 during a subsequent anneal process. The diffusionsuppressant species 256 may be implanted at a total dose of 1×10¹⁴ cm⁻²to 1×10¹⁶ cm⁻² to provide a density of at least 1×10²⁰ cm⁻³ in theactive areas for the n-type and p-type thermoelectric elements 212 and214.

Referring to FIG. 2B, dielectric material is formed in the isolationtrenches 252 and over the isolation hard mask 250 of FIG. 2A. Thedielectric material may include one or more layers of silicon dioxide,and possibly silicon oxynitride and/or silicon nitride. The dielectricmaterial may be formed by an atmospheric pressure chemical deposition(APCVD) process, a sub-atmospheric pressure chemical deposition (SACVD)process, a high density plasma (HDP) process, or a chemical vapordeposition process using ozone and tetraethyl orthosilicate (TEOS)referred to as a high aspect ratio process (HARP). The dielectricmaterial is planarized, for example by a chemical mechanical polish(CMP) process so that a top surface of the dielectric material issubstantially coplanar with the top surface 216 of the substrate 202.The isolation hard mask 250 is removed, leaving the dielectric materialin the isolation trenches 252 to provide field oxide 218 laterallyisolating active areas of the integrated circuit 200.

Referring to FIG. 2C, an n-type well mask 258 is formed over thesubstrate 202 so as to expose areas for n-type wells in the area for theCMOS transistors 204 and the n-type thermoelectric elements 212 in thearea for the embedded thermoelectric device 206. The n-type well mask258 may include photoresist formed by a photolithographic process.N-type dopants 260 such as phosphorus and arsenic are implanted into thesubstrate 202 in areas exposed by the n-type well mask 258. The n-typedopants 260 may be implanted at a total dose of 2×10¹³ cm⁻² to 2×10¹⁴cm⁻² and energies of 40 keV to 500 keV. The n-type well mask 258 issubsequently removed, for example by an ash process followed by a wetclean process using an aqueous mixture of sulfuric acid and hydrogenperoxide. After the n-type well mask 258 is removed, the substrate 202is annealed so as to activate the implanted n-type dopants 260 to formn-type wells 244. Forming the n-type wells 244 concurrently in the areafor the CMOS transistors 204 and the n-type thermoelectric elements 212in the area for the embedded thermoelectric device 206 advantageouslyreduces fabrication cost and complexity of the integrated circuit 200.

Referring to FIG. 2D, a p-type well mask 262 is formed over thesubstrate 202 so as to expose areas for p-type wells in the area for theCMOS transistors 204 and the p-type thermoelectric elements 214 in thearea for the embedded thermoelectric device 206. The p-type well mask262 may be formed similarly to the n-type well mask 258 of FIG. 2C.P-type dopants 264 such as boron and indium are implanted into thesubstrate 202 in areas exposed by the p-type well mask 262. The p-typedopants 264 may be implanted at a total dose of 2×10¹³ cm⁻² to 2×10¹⁴cm⁻² and energies of 10 keV to 250 keV. The p-type well mask 262 issubsequently removed as described in reference to FIG. 2C. After thep-type well mask 262 is removed, the substrate 202 is annealed so as toactivate the implanted p-type dopants 264 to form p-type wells 242. Theanneal process to activate the implanted p-type dopants 264 may beconcurrent with the anneal process to activate the implanted n-typedopants 260 of FIG. 2C. Forming the p-type wells 242 concurrently in thearea for the CMOS transistors 204 and the p-type thermoelectric elements214 in the area for the embedded thermoelectric device 206advantageously reduces fabrication cost and complexity of the integratedcircuit 200.

Referring to FIG. 2E, a gate structure 220 of an NMOS transistor 208 anda gate structure 224 of a PMOS transistor 210 are formed over thesubstrate in the area for the CMOS transistors 204. The gate structure220 of the NMOS transistor 208 is formed over the p-type well 242, andthe gate structure 224 of the PMOS transistor 210 is formed over then-type well 244. Parts or all of the gate structures 220 and 224 may beformed concurrently.

Referring to FIG. 2F, an n-channel source/drain (NSD) mask 266 is formedover an existing surface of the integrated circuit 200 so as to exposethe NMOS transistor 208 and cover the PMOS transistor 210. The NSD mask266 may optionally expose the n-type thermoelectric elements 212 asshown in FIG. 2F. N-type dopants 268 such as phosphorus, arsenic andpossibly antimony are implanted into the substrate 202 in the areasexposed by the NSD mask 266. The NSD mask 266 is subsequently removed asdescribed in reference to FIG. 2C. After the NSD mask 266 is removed,the substrate 202 is annealed so as to activate the implanted n-typedopants 268 to form n-type source/drain regions 222 in the NMOStransistor 208. If the NSD mask 266 exposed the n-type thermoelectricelements 212, the implanted n-type dopants 268 add to an n-type dopantdistribution there, which advantageously reduces an electricalresistance of the n-type thermoelectric elements 212 without increasingfabrication cost and complexity of the integrated circuit 200.

Referring to FIG. 2G, a p-channel source/drain (PSD) mask 270 is formedover an existing surface of the integrated circuit 200 so as to exposethe PMOS transistor 210 and cover the NMOS transistor 208. The PSD mask270 may optionally expose the p-type thermoelectric elements 214 asshown in FIG. 2G. P-type dopants 272 such as boron, gallium and possiblyindium are implanted into the substrate 202 in the areas exposed by thePSD mask 270. The PSD mask 270 is subsequently removed as described inreference to FIG. 2C. After the PSD mask 270 is removed, the substrate202 is annealed so as to activate the implanted p-type dopants 272 toform p-type source/drain regions 226 in the PMOS transistor 210. If thePSD mask 270 exposed the p-type thermoelectric elements 214, theimplanted p-type dopants 272 add to a p-type dopant distribution there,which advantageously reduces an electrical resistance of the p-typethermoelectric elements 214 without increasing fabrication cost andcomplexity of the integrated circuit 200. Formation of the integratedcircuit 200 is continued by formation of interconnect structures in thearea of the CMOS transistors 204 and the area of the embeddedthermoelectric device 206, for example similar shown in FIG. 1.

FIG. 3A and FIG. 3B are cross sections of another example integratedcircuit containing CMOS transistors and an embedded thermoelectricdevice, depicted in successive stages of an example fabricationsequence. Referring to FIG. 3A, the integrated circuit 300 is formed ona substrate 302 including silicon-based semiconductor material. Theintegrated circuit 300 includes an area for the CMOS transistors 304 andan area for the embedded thermoelectric device 306. An isolation hardmask 350 is formed over the substrate 302 so as to cover active areas ofthe integrated circuit 300 and expose areas for subsequently-formedfield oxide. Isolation trenches 352 are formed in the substrate 302 inareas exposed by the isolation hard mask 350. The active areas includeareas for n-type thermoelectric elements 312 and p-type thermoelectricelements 314 of the embedded thermoelectric device 306.

A germanium implant mask 374 is formed over an existing top surface ofthe integrated circuit 300 so as to expose the areas for the n-typethermoelectric elements 312 and the p-type thermoelectric elements 314,and cover the area for the CMOS transistors 304. The germanium implantmask 374 may include, for example, photoresist formed by aphotolithographic process, or may include silicon dioxide formed by apattern and etch process.

Germanium 354 is implanted into the substrate 302 to form a germaniumimplanted region 348 along the exposed sides and bottom surfaces of theisolation trenches 352 as described in reference to FIG. 2A. Thegermanium 354 may be implanted with a dose sufficient to provide atleast 5 atomic percent germanium in the active areas for the n-type andp-type thermoelectric elements 312 and 314. A diffusion suppressantspecies 356 such as carbon and/or fluorine, may optionally be implantedinto the substrate 302 along the exposed sides and bottom surfaces ofthe isolation trenches 352 as described in reference to FIG. 2A. Formingthe germanium implant mask 374 to cover the area for the CMOStransistors 304 may advantageously allow a higher density of implantedgermanium 354 in the n-type thermoelectric elements 312 and the p-typethermoelectric elements 314 without degrading performance of asubsequently formed NMOS transistor and PMOS transistor. The higherdensity of implanted germanium 354 advantageously reduces thermalconduction in the n-type thermoelectric elements 312 and the p-typethermoelectric elements 314.

Referring to FIG. 3B, semiconductor material is removed from thesubstrate 202 at bottom surfaces of the isolation trenches 352 in thearea for the embedded thermoelectric device 306 while significantly lessmaterial is removed from side surfaces of the isolation trenches 352, sothat a thickness of the germanium implanted region 348 under theisolation trenches 352 is reduced by at least 50 percent while lateraldimensions of the n-type and p-type thermoelectric elements 312 and 314are reduced by less than 10 percent. The semiconductor material may beremoved from the bottom surfaces of the isolation trenches 352 by ananisotropic etch process 376 such as an RIE process 376. Alternatively,the side surfaces of the isolation trenches 352 may be protected with adielectric layer prior to the semiconductor material being removed fromthe substrate 202 by a semi-isotropic etch process. In one version ofthe instant example, the semiconductor material may be removed from thebottom surfaces of the isolation trenches 352 while the germaniumimplant mask 374 is in place, as shown in FIG. 3B. In another version,the germanium implant mask 374 may be removed before the semiconductormaterial is removed, so that the semiconductor material is removed fromthe bottom surfaces of the isolation trenches 352 in both the area forthe embedded thermoelectric device 306 and in the area for the CMOStransistors 304. Reducing the thickness of the germanium implantedregion 348 under the isolation trenches 352 by at least 50 percent mayadvantageously decrease a thermal resistance from the n-type and p-typethermoelectric elements 312 and 314 to thermal taps of the embeddedthermoelectric device 306.

FIG. 4A and FIG. 4B are cross sections of another example integratedcircuit containing CMOS transistors and an embedded thermoelectricdevice, depicted in successive stages of an example fabricationsequence. Referring to FIG. 4A, the integrated circuit 400 is formed ona substrate 402 including silicon-based semiconductor material. Theintegrated circuit 400 includes an area for the CMOS transistors 404 andan area for the embedded thermoelectric device 406. An isolation hardmask 450 is formed over the substrate 402 so as to cover active areas ofthe integrated circuit 400 and expose areas for subsequently-formedfield oxide. Isolation trenches 452 are formed in the substrate 402 inareas exposed by the isolation hard mask 450. The active areas includeareas for n-type thermoelectric elements 412 and p-type thermoelectricelements 414 of the embedded thermoelectric device 406.

A first germanium implant mask 474 is formed over an existing topsurface of the integrated circuit 400 so as to expose the areas for then-type thermoelectric elements 412 and cover the p-type thermoelectricelements 414 and the area for the CMOS transistors 404. The firstgermanium implant mask 474 may be formed similarly to the germaniumimplant mask 374 of FIG. 3A.

Side and bottom surfaces of the isolation trenches 452 exposed by thefirst germanium implant mask 474 are roughened by an etch process 478such as an aqueous phosphoric acid etch process 478. Forming theroughened side surfaces of the isolation trenches 452 may advantageouslyreduce thermal conductance in the n-type thermoelectric elements 412 byincreasing phonon scattering at the roughened surfaces.

Referring to FIG. 4B, while the first germanium implant mask 474 is inplace, germanium 454 is implanted into the substrate 402 to form a firstgermanium implanted region 448 along the exposed sides and bottomsurfaces of the isolation trenches 452 adjacent to the n-typethermoelectric elements 412. The germanium 454 may be implanted with adose sufficient to provide at least 5 atomic percent germanium in theactive areas for the n-type thermoelectric elements 412. A diffusionsuppressant species 456 such as carbon and/or fluorine, may optionallybe implanted into the substrate 402 along the exposed sides and bottomsurfaces of the isolation trenches 452 adjacent to the n-typethermoelectric elements 412. N-type dopants 480 such as phosphorus,arsenic and/or antimony are implanted into the substrate 402 along theexposed sides and bottom surfaces of the isolation trenches 452 adjacentto the n-type thermoelectric elements 412. The n-type dopants 480 may beimplanted with a dose sufficient to provide a doping density of 3×10¹⁸cm⁻³ to 1×10²⁰ cm⁻³ in the n-type thermoelectric elements 412. In analternate version of the instant example, the germanium 454, thediffusion suppressant species 456 and the n-type dopants 480 may beimplanted before the side and bottom surfaces of the isolation trenches452 are roughened.

Forming the first germanium implant mask 474 to cover the area for thep-type thermoelectric elements 414 and the CMOS transistors 404 mayadvantageously allow a higher density of implanted germanium 454 andn-type dopants 480 in the n-type thermoelectric elements 412 withoutdegrading performance of a subsequently formed NMOS transistor and PMOStransistor. The higher density of implanted germanium 454 advantageouslyreduces thermal conduction in the n-type thermoelectric elements 412.The higher density of n-type dopants 480 advantageously reduceselectrical resistance in the n-type thermoelectric elements 412.Formation of the integrated circuit 400 may also include forming asecond germanium implant mask which exposes the areas for the p-typethermoelectric elements 414 and cover the n-type thermoelectric elements412 and the area for the CMOS transistors 404, followed by a rougheningetch and implantation of germanium, diffusion suppressants and p-typedopants, thereby accruing similar advantages.

FIG. 5A and FIG. 5B are cross sections of another example integratedcircuit containing CMOS transistors and an embedded thermoelectricdevice, depicted in successive stages of an example fabricationsequence. Referring to FIG. 5A, the integrated circuit 500 is formed ona substrate 502 including silicon-based semiconductor material, with anarea for the CMOS transistors 504 and an area for the embeddedthermoelectric device 506. An isolation hard mask 550 is formed over thesubstrate 502 so as to cover active areas of the integrated circuit 500and expose areas for subsequently-formed field oxide. Isolation trenches552 are formed in the substrate 502 in areas exposed by the isolationhard mask 550. The active areas include areas for n-type thermoelectricelements 512 and p-type thermoelectric elements 514 of the embeddedthermoelectric device 506.

A first germanium implant mask 574 is formed over an existing topsurface of the integrated circuit 500 so as to expose the areas for thep-type thermoelectric elements 514 and cover the n-type thermoelectricelements 512 and the area for the CMOS transistors 504. The firstgermanium implant mask 574 may be formed similarly to the germaniumimplant mask 374 of FIG. 3A.

Semiconductor material of the substrate 502 at side and bottom surfacesof the isolation trenches 552 exposed by the first germanium implantmask 574 is removed by an isotropic etch process 582 such as anisotropic plasma etch process 582 which reduces lateral dimensions ofthe p-type thermoelectric elements 514. Reducing the lateral dimensionsof the p-type thermoelectric elements 514 may advantageously reducethermal conductance in the p-type thermoelectric elements 514 byincreasing phonon scattering.

Referring to FIG. 5B, while the first germanium implant mask 574 is inplace, germanium 554 is implanted into the substrate 502 to form a firstgermanium implanted region 548 along the exposed sides and bottomsurfaces of the isolation trenches 552 adjacent to the p-typethermoelectric elements 514, for example with a dose sufficient toprovide at least 5 atomic percent germanium in the active areas for thep-type thermoelectric elements 514. A diffusion suppressant species 556such as carbon and/or fluorine, may optionally be implanted as describedin reference to FIG. 4B. P-type dopants 580 such as boron, galliumand/or indium are implanted into the substrate 502 along the exposedsides and bottom surfaces of the isolation trenches 552 adjacent to thep-type thermoelectric elements 514, for example with a dose sufficientto provide a doping density of 3×10¹⁸ cm⁻³ to 1×10²⁰ cm⁻³ in the p-typethermoelectric elements 514. In an alternate version of the instantexample, the germanium 554, the diffusion suppressant species 556 andthe p-type dopants 580 may be implanted before the lateral dimensions ofthe p-type thermoelectric elements 514 are reduced.

Forming the first germanium implant mask 574 to cover the area for then-type thermoelectric elements 512 and the CMOS transistors 504 mayaccrue the advantages described in reference to FIG. 4B. Formation ofthe integrated circuit 500 may also include forming a second germaniumimplant mask which exposes the areas for the n-type thermoelectricelements 512 and cover the p-type thermoelectric elements 514 and thearea for the CMOS transistors 504, followed by reducing lateraldimensions of the n-type thermoelectric elements 512 and implantation ofgermanium, diffusion suppressants and n-type dopants, thereby accruingsimilar advantages.

FIG. 6A and FIG. 6B are cross sections of another example integratedcircuit containing CMOS transistors and an embedded thermoelectricdevice, depicted in successive stages of an example fabricationsequence. Referring to FIG. 6A, the integrated circuit 600 is formed ona substrate 602 including silicon-based semiconductor material. Theintegrated circuit 600 includes an area for the CMOS transistors 604 andan area for the embedded thermoelectric device 606. Before isolationtrenches are formed in the substrate 602, germanium 654 is blanketimplanted into the substrate 602 to form a blanket germanium implantedregion 648 which extends across the area for the CMOS transistors 604and the area for the embedded thermoelectric device 606. The germanium654 may be implanted with a total dose sufficient to provide at least 1atomic percent germanium in the blanket germanium implanted region 648.The germanium 654 may be implanted in a series of steps with energies toprovide a desired uniformity of a distribution of the implantedgermanium 654 throughout a depth encompassing to-be-formedthermoelectric elements of the embedded thermoelectric device 606. Inone version of the instant example, the germanium 654 may be implantedso as to provide a final depth of the blanket germanium implanted region648 which is approximately as deep as to-be-formed field oxide.Diffusion suppressant species may optionally be implanted into thesubstrate 602. Implanting the germanium 654 using the blanket implantprocess may advantageously reduce fabrication cost and complexity of theintegrated circuit 600.

Referring to FIG. 6B, field oxide 618 is formed in the substrate 602 soas to define active areas for an NMOS transistor 608 and a PMOStransistor 610 in the area for the CMOS transistors 604 and for n-typethermoelectric elements 612 and p-type thermoelectric elements 614 ofthe embedded thermoelectric device 606. In one version of the instantexample, the blanket germanium implanted region 648 extendsapproximately as deep as the field oxide 618, which may advantageouslyreduce thermal resistance of the substrate 602 between adjacentinstances of the n-type thermoelectric elements 612 and the p-typethermoelectric elements 614. One or more p-type wells 642 are formed inthe substrate 602 under the NMOS transistor 608 and the p-typethermoelectric elements 614. One or more n-type wells 644 are formed inthe substrate 602 under the PMOS transistor 608 and the n-typethermoelectric elements 612. A dielectric layer stack 646 and metalinterconnects 684 are formed over the substrate 602 to provideinterconnects to the NMOS and PMOS transistors 608 and 610 and theembedded thermoelectric device 606.

In an alternate version of the instant example, the germanium 654 may beblanket implanted into the substrate 602 after the field oxide 618 isformed. Similar advantages of reduced fabrication cost and complexity ofthe integrated circuit 600 may be accrued.

FIG. 7A and FIG. 7B are cross sections of another example integratedcircuit containing CMOS transistors and an embedded thermoelectricdevice, depicted in successive stages of an example fabricationsequence. Referring to FIG. 7A, the integrated circuit 700 is formed ona substrate 702 including silicon-based semiconductor material. Theintegrated circuit 700 includes an area for the CMOS transistors 704 andan area for the embedded thermoelectric device 706. Field oxide 718 isformed in the substrate 702 so as to define active areas for an NMOStransistor 708 and a PMOS transistor 710 in the area for the CMOStransistors 704 and for n-type thermoelectric elements 712 and p-typethermoelectric elements 714 of the embedded thermoelectric device 706. Agermanium implant mask 774 is formed over an existing top surface of theintegrated circuit 700 so as to expose the areas for the n-typethermoelectric elements 712 and the p-type thermoelectric elements 714,and cover the area for the CMOS transistors 704. The germanium implantmask 774 may be formed as described in reference to FIG. 3A. Thegermanium implant mask 774 may include optional blocking elements 786which are disposed over the field oxide 718 in the embeddedthermoelectric device 706 so as to block germanium from the substrate702 between adjacent instances of the n-type thermoelectric elements 712and the p-type thermoelectric elements 714. Germanium 754 is implantedinto the substrate 702 in areas exposed by the germanium implant mask774 to form a germanium implanted region 748 in the area for theembedded thermoelectric device 706. If the optional blocking elements786 are formed, the germanium implanted region 748 may be limited to then-type and p-type thermoelectric elements 712 and 714, as depicted inFIG. 7A. The germanium 754 may be implanted with a total dose sufficientto provide at least 5 atomic percent germanium in the blanket germaniumimplanted region 748. The germanium 754 may be implanted in a series ofsteps with energies to provide a desired uniformity of a distribution ofthe implanted germanium 754 throughout a depth encompassing the n-typethermoelectric elements 712 and the p-type thermoelectric elements 714.Diffusion suppressant species may optionally be implanted into thesubstrate 702. Forming the germanium implant mask 774 to spatially limitthe implanted germanium 754 may advantageously allow a higher density ofimplanted germanium 754 in the n-type and p-type thermoelectric elements712 and 714 without degrading performance of a subsequently formed NMOStransistor and PMOS transistor, as explained in reference to FIG. 3B.Forming the blocking elements 786 may advantageously prevent theimplanted germanium 754 from reducing thermal conductivity of thesubstrate 702 between adjacent instances of the n-type and p-typethermoelectric elements 712 and 714, thus improving performance of theembedded thermoelectric device 706.

Referring to FIG. 7B, One or more p-type wells 742 are formed in thesubstrate 702 under the NMOS transistor 708 and the p-typethermoelectric elements 714. One or more n-type wells 744 are formed inthe substrate 702 under the PMOS transistor 708 and the n-typethermoelectric elements 712. A dielectric layer stack 746 and metalinterconnects 784 are formed over the substrate 702 to provideinterconnects to the NMOS and PMOS transistors 708 and 710 and theembedded thermoelectric device 706.

In an alternate version of the instant example, the germanium 754 may beblanket implanted into the substrate 702 after the p-type wells 742 andthe n-type wells 744 are formed. In an alternate version of the instantexample, the germanium 754 may be blanket implanted into the substrate702 before the field oxide 718 is formed. In an alternate version of theinstant example, the germanium 754 may be blanket implanted into thesubstrate 702 after the p-type wells 742 and the n-type wells 744 areformed. Similar advantages of improved performance of the embeddedthermoelectric device 706 may be accrued.

FIG. 8 and FIG. 9 are top views of example integrated circuitscontaining CMOS transistors and embedded thermoelectric devices.Referring to FIG. 8, the integrated circuit 800 is formed on a substrate802 including silicon-based semiconductor material. Field oxide is notshown in FIG. 8 to more clearly show the active areas of the integratedcircuit 800. The integrated circuit 800 includes an area for the CMOStransistors 804 and an area for the embedded thermoelectric device 806.

The CMOS transistors 804 include NMOS transistors 808 and PMOStransistors 810. The NMOS transistors 808 are formed on active areas 888and include n-type source/drain regions 822 in the active areas 888 andgate structures 820 over the active areas 888. The PMOS transistors 810are formed on active areas 890 and include p-type source/drain regions826 in the active areas 890 and gate structures 824 over the activeareas 890.

The embedded thermoelectric device 806 includes n-type thermoelectricelements 812 and p-type thermoelectric elements 814 in arrays of linearactive areas 892. An active area 894 may surround the n-type and p-typethermoelectric elements 812 and 814 to provide a thermal connection fromthe substrate 802 to thermal taps to terminals of the embeddedthermoelectric device 806. Configuring the n-type and p-typethermoelectric elements 812 and 814 in the arrays of linear active areas892 may provide higher thermoelectric power generation density per unitarea compared to other configurations of the arrays of the n-type andp-type thermoelectric elements 812 and 814. The integrated circuit 800may be formed by any of the example process sequences described herein.

Referring to FIG. 9, the integrated circuit 900 is formed on a substrate902 including silicon-based semiconductor material. Field oxide is notshown in FIG. 9 to more clearly show the active areas of the integratedcircuit 900. The integrated circuit 900 includes an area for the CMOStransistors 904 and an area for the embedded thermoelectric device 906.

The CMOS transistors 904 include NMOS transistors 908 and PMOStransistors 910. The NMOS transistors 908 are formed on active areas 988and include n-type source/drain regions 922 in the active areas 988 andgate structures 920 over the active areas 988. The PMOS transistors 910are formed on active areas 990 and include p-type source/drain regions926 in the active areas 990 and gate structures 924 over the activeareas 990.

The embedded thermoelectric device 906 includes n-type thermoelectricelements 912 and p-type thermoelectric elements 914 in arrays of pillaractive areas 992. An active area 994 may surround the n-type and p-typethermoelectric elements 912 and 914 to provide a thermal connection fromthe substrate 902 to thermal taps to terminals of the embeddedthermoelectric device 906. Configuring the n-type and p-typethermoelectric elements 912 and 914 in the arrays of pillar active areas992 may provide higher thermoelectric power generation efficiencycompared to other configurations of the arrays of the n-type and p-typethermoelectric elements 912 and 914, due to reduced thermal conductionin the pillar active areas 992 from phono scattering at sides of thepillar active areas 992. The integrated circuit 900 may be formed by anyof the example process sequences described herein.

Although illustrative embodiments have been shown and described by wayof example, a wide range of alternative embodiments is possible withinthe scope of the foregoing disclosure.

What is claimed is:
 1. An integrated circuit, comprising: a substratecomprising silicon-based semiconductor material; field oxide inisolation trenches in the substrate, the field oxide providing lateralisolation for an n-channel metal oxide semiconductor (NMOS) transistorand a p-channel metal oxide semiconductor (PMOS) transistor in an areafor complementary metal oxide semiconductor (CMOS) transistors of theintegrated circuit, and providing lateral isolation for n-typethermoelectric elements and p-type thermoelectric elements of anembedded thermoelectric device of the integrated circuit; a metalinterconnect structure which connects upper ends of the n-typethermoelectric elements and the p-type thermoelectric elements to athermal node; and a germanium implanted region in the substrateencompassing the n-type thermoelectric elements and the p-typethermoelectric elements, the germanium implanted region having at least0.10 atomic percent germanium in the n-type thermoelectric elements andthe p-type thermoelectric elements.
 2. The integrated circuit of claim1, wherein the germanium implanted region having at least 1 atomicpercent germanium in the n-type thermoelectric elements and the p-typethermoelectric elements.
 3. The integrated circuit of claim 1, whereinthe germanium implanted region having at least 3 atomic percentgermanium in the n-type thermoelectric elements and the p-typethermoelectric elements.
 4. The integrated circuit of claim 1, whereinthe germanium implanted region extends across the area for the CMOStransistors.
 5. The integrated circuit of claim 1, wherein the germaniumimplanted region extends approximately as deep in the substrate as thefield oxide.
 6. The integrated circuit of claim 1, wherein the germaniumimplanted region includes a diffusion suppressant species with a densityof at least 1×10²⁰ cm⁻³ in the n-type thermoelectric elements and thep-type thermoelectric elements, the diffusion suppressant species beingselected from the group consisting of fluorine and carbon.
 7. A methodof forming an integrated circuit, the method comprising: providing asubstrate comprising silicon-based semiconductor material; formingisolation trenches in the substrate, the substrate between the isolationtrenches providing active areas of the integrated circuit, the activeareas including active areas for an NMOS transistor and a PMOStransistor in an area for CMOS transistors of the integrated circuit,and for n-type thermoelectric elements and p-type thermoelectricelements of an embedded thermoelectric device of the integrated circuit;subsequently implanting germanium into the n-type thermoelectricelements and the p-type thermoelectric elements with a dose sufficientto provide at least 0.10 atomic percent germanium in the n-typethermoelectric elements and the p-type thermoelectric elements; andsubsequently forming dielectric material in the isolation trenches toprovide field oxide of the integrated circuit.
 8. The method of claim 7,and comprising implanting a diffusion suppressant species at a dose of1×10¹⁴ cm⁻² to 1×10¹⁶ cm⁻² in the n-type thermoelectric elements and thep-type thermoelectric elements, after forming the isolation trenches andbefore forming the dielectric material in the isolation trenches, thediffusion suppressant species being selected from the group consistingof fluorine and carbon.
 9. The method of claim 7, wherein subsequentlyimplanting germanium includes implanting germanium into the n-typethermoelectric elements and the p-type thermoelectric elements with adose sufficient to provide at least 1 atomic percent germanium in then-type thermoelectric elements and the p-type thermoelectric elements.10. The method of claim 7, wherein subsequently implanting germaniumincludes implanting germanium into the n-type thermoelectric elementsand the p-type thermoelectric elements with a dose sufficient to provideat least 3 atomic percent germanium in the n-type thermoelectricelements and the p-type thermoelectric elements.
 11. The method of claim7, wherein subsequently implanting germanium includes implantinggermanium into the n-type thermoelectric elements and the p-typethermoelectric elements by a blanket implant process which implants thegermanium into the substrate across the area for the CMOS transistors.12. The method of claim 7, and comprising: forming a germanium implantmask over the substrate so as to cover the area for the CMOStransistors, after forming the isolation trenches and before implantingthe germanium; and removing the germanium implant mask after implantingthe germanium and before forming the dielectric material in theisolation trenches.
 13. The method of claim 12, and comprising removingsemiconductor material from the substrate at bottom surfaces of theisolation trenches in the area for the embedded thermoelectric device,after implanting the germanium and before removing the germanium implantmask.
 14. The method of claim 12, wherein the germanium implant maskexposes the n-type thermoelectric elements and covers the p-typethermoelectric elements, and further comprising implanting n-typedopants into the n-type thermoelectric elements while the germaniumimplant mask is in place.
 15. The method of claim 12, wherein thegermanium implant mask exposes the p-type thermoelectric elements andcovers the n-type thermoelectric elements, and further comprisingimplanting p-type dopants into the p-type thermoelectric elements whilethe germanium implant mask is in place.
 16. A method of forming anintegrated circuit, the method comprising: providing a substratecomprising silicon-based semiconductor material; forming isolationtrenches in the substrate, the substrate between the isolation trenchesproviding active areas of the integrated circuit, the active areasincluding active areas for an NMOS transistor and a PMOS transistor inan area for CMOS transistors of the integrated circuit, and for n-typethermoelectric elements and p-type thermoelectric elements of anembedded thermoelectric device of the integrated circuit, the n-typethermoelectric elements and the p-type thermoelectric elements beingless than 300 nanometers wide at a narrowest position; formingdielectric material in the isolation trenches to provide field oxide ofthe integrated circuit; and implanting germanium into the n-typethermoelectric elements and the p-type thermoelectric elements with adose sufficient to provide at least 0.10 atomic percent germanium in then-type thermoelectric elements and the p-type thermoelectric elements.17. The method of claim 16, wherein implanting germanium into the n-typethermoelectric elements and the p-type thermoelectric elements isperformed prior to forming the isolation trenches.
 18. The method ofclaim 16, wherein implanting germanium into the n-type thermoelectricelements and the p-type thermoelectric elements is performed afterforming the dielectric material in the isolation trenches.
 19. Themethod of claim 16, and comprising: forming a germanium implant maskover the substrate so as to cover the area for the CMOS transistors,before implanting the germanium; and removing the germanium implant maskafter implanting the germanium.
 20. The method of claim 19, wherein thegermanium implant mask includes blocking elements in the area for theembedded thermoelectric device so as to block the germanium from thesubstrate between adjacent instances of the n-type thermoelectricelements and adjacent instances of the p-type thermoelectric elements.